ERROR ANALYSIS AND PREVENTION OF COSMIC ION-INDUCED SOFT ERRORS IN STATIC CMOS RAMS

被引：54

作者：

DIEHL, SE

OCHOA, A

DRESSENDORFER, PV

KOGA, R

KOLASINSKI, WA

机构：

[1] SANDIA NATL LABS,DIV 2144,ALBUQUERQUE,NM 87185

[2] AEROSPACE CORP,SPACE SCI LAB,LOS ANGELES,CA 90009

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1982年 / 29卷 / 06期

关键词：

D O I：

10.1109/TNS.1982.4336491

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2032 / 2039

页数：8

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