ERROR ANALYSIS AND PREVENTION OF COSMIC ION-INDUCED SOFT ERRORS IN STATIC CMOS RAMS

被引：54
作者：
DIEHL, SE
OCHOA, A
DRESSENDORFER, PV
KOGA, R
KOLASINSKI, WA
机构：
[1] SANDIA NATL LABS,DIV 2144,ALBUQUERQUE,NM 87185
[2] AEROSPACE CORP,SPACE SCI LAB,LOS ANGELES,CA 90009
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1982年 / 29卷 / 06期
关键词：
D O I：
10.1109/TNS.1982.4336491
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：2032 / 2039
页数：8
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