SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE SPECTROSCOPY MEASUREMENT USING THE EVANESCENT-WAVE EFFECT OF FLUORESCENT X-RAYS

被引：25

作者：

SUZUKI, Y

机构：

来源：

PHYSICAL REVIEW B | 1989年 / 39卷 / 05期

关键词：

D O I：

10.1103/PhysRevB.39.3393

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：3393 / 3395

页数：3

共 11 条

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