ATOMIC GEOMETRY OF GASB(110) - DETERMINATION VIA ELASTIC LOW-ENERGY ELECTRON-DIFFRACTION INTENSITY ANALYSIS

被引：27

作者：

DUKE, CB ^{[1
]}

PATON, A ^{[1
]}

KAHN, A ^{[1
]}

机构：

[1] PRINCETON UNIV OBSERV,DEPT ELECT ENGN & COMP SCI,PRINCETON,NJ 08544

来源：

PHYSICAL REVIEW B | 1983年 / 27卷 / 06期

关键词：

D O I：

10.1103/PhysRevB.27.3436

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：3436 / 3444

页数：9

共 30 条

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[6] (110) SURFACE ATOMIC STRUCTURES OF COVALENT AND IONIC SEMICONDUCTORS
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[9] Duke C.B., 1974, ADV CHEM PHYS, V27, P1
[10] ATOMIC GEOMETRY OF CLEAVAGE SURFACES OF TETRAHEDRALLY COORDINATED COMPOUND SEMICONDUCTORS
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