A CHARACTERISTIC FLUORESCENCE CORRECTION FACTOR FOR USE IN ELECTRON-PROBE MICROANALYSIS .2. EVALUATION OF EXPERIMENTAL RESULTS AND COMPARISONS

被引:2
作者
SCHIEBL, C
AUGUST, HJ
WERNISCH, J
机构
[1] VIENNA TECH UNIV,INST ANGEW & TECH PHYS,WIEDNER HAUPTSTR 8-10,A-1040 VIENNA,AUSTRIA
[2] DIGITAL EQUIPMENT CORP,CTR CAMPUS BASED ENGN,A-1040 VIENNA,AUSTRIA
来源
MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 1991年 / 2卷 / 04期
关键词
D O I
10.1051/mmm:0199100204042500
中图分类号
TH742 [显微镜];
学科分类号
摘要
A comparison of a recently published secondary characteristic fluorescence correction method especially with the in electron probe microanalysis commonly used Reed procedure is presented along with evaluations of experimental data from literature taking into account the fluorescence correction using the new model. Special attention is directed to the choice of fundamental parameters, such as mass absorption coefficients, fluorescence yields, relative intensities and ionization cross sections, which are found to influence the corresponding results considerably.
引用
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页码:425 / 442
页数:18
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