EVALUATION TESTING OF INTEGRATED-CIRCUITS

被引：0

|

作者：

HOMAN, RA ^{[1
]}

ROSSMAN, MW ^{[1
]}

机构：

[1] MARTIN MARIETTA CORP,ELECTR DEPT,POB 179,DENVER,CO 80201

来源：

PROCEEDINGS ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM | 1975年 / JAN28期

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：372 / 376

页数：5

相关论文

共 50 条

[1] LOGIC TESTING OF INTEGRATED-CIRCUITS
ROBACH, C
SAUCIER, G
ONDE ELECTRIQUE, 1978, 58 (12): : 842 - 849
[2] LASER TESTING OF INTEGRATED-CIRCUITS
SMITH, JG
OLDHAM, HE
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1977, 12 (03) : 247 - 252
[3] AUTOMATIC TESTING OF INTEGRATED-CIRCUITS
BETTE, HP
ELECTRONICS AND POWER, 1977, 23 (05): : 380 - 384
[4] EFFECTIVE TESTING OF DIGITAL INTEGRATED-CIRCUITS
PADWICK, GC
SOLID STATE TECHNOLOGY, 1972, 15 (03) : 46 - &
[5] OPERATIONAL LIFE TESTING OF INTEGRATED-CIRCUITS
FARNHOLTZ, DF
PROCEEDINGS ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM, 1985, (NSYM): : 441 - 443
[6] AUTOMATIC TESTING INSTRUMENT FOR INTEGRATED-CIRCUITS
SIMONINLAURENT, JP
ACTA CIENTIFICA VENEZOLANA, 1978, 29 : 117 - 117
[7] AUTOMATIC TESTING OF COMPLEX INTEGRATED-CIRCUITS
LIVINGSTONE, AW
POST OFFICE ELECTRICAL ENGINEERS JOURNAL, 1977, 70 (OCT): : 161 - 167
[8] TESTING AND DEBUGGING CUSTOM INTEGRATED-CIRCUITS
FRANK, EH
SPROULL, RF
COMPUTING SURVEYS, 1981, 13 (04) : 425 - 451
[9] INTEGRATED TESTING AND ALGORITHMS FOR VISUAL INSPECTION OF INTEGRATED-CIRCUITS
PAU, LF
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1983, 5 (06) : 602 - 608
[10] PROBLEMS CONNECTED TO THE TESTING OF DIGITAL INTEGRATED-CIRCUITS
FANTINI, F
MORANDI, C
SENIN, A
ELETTROTECNICA, 1984, 71 (05): : 391 - 403

← 1 2 3 4 5 →