OPTICALLY CW-INDUCED LOSSES IN SEMICONDUCTOR COPLANAR WAVE-GUIDES

被引：58

作者：

PLATTE, W ^{[1
]}

SAUERER, B ^{[1
]}

机构：

[1] MESSERSCHMITT BOELKOW BLOHM GMBH,DIV SPACE COMMUN & PROP SYST,D-8000 MUENCHEN 80,FED REP GER

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1989年 / 37卷 / 01期

关键词：

D O I：

10.1109/22.20032

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：139 / 149

页数：11

共 26 条

[1]

Abramowitz M., 1970, HDB MATH FNCTIONS

[2]

ADLER RB, 1964, SEMICONDUCTOR ELECTR, V1

[3]

Ambroziak A., 1968, SEMICONDUCTOR PHOTOE

[4] PICOSECOND OPTOELECTRONIC DETECTION, SAMPLING, AND CORRELATION-MEASUREMENTS IN AMORPHOUS-SEMICONDUCTORS [J].

AUSTON, DH ;

JOHNSON, AM ;

SMITH, PR ;

BEAN, JC .

APPLIED PHYSICS LETTERS, 1980, 37 (04) :371-373

[5] GENERATION AND DETECTION OF MILLIMETER WAVES BY PICOSECOND PHOTOCONDUCTIVITY [J].

AUSTON, DH ;

SMITH, PR .

APPLIED PHYSICS LETTERS, 1983, 43 (07) :631-633

[6]

BYRD PF, 1954, HDB ELLIPTIC INTEGRA

[7] PICOSECOND OPTOELECTRONIC MEASUREMENT OF THE HIGH-FREQUENCY SCATTERING PARAMETERS OF A GaAs FET. [J].

Cooper, Donald E. ;

Moss, Steven C. .

IEEE Journal of Quantum Electronics, 1986, QE-22 (01) :94-100

[8] INTRINSIC OPTICAL ABSORPTION IN SINGLE-CRYSTAL GERMANIUM AND SILICON AT 77-DEGREES-K AND 300-DEGREES-K [J].

DASH, WC ;

NEWMAN, R .

PHYSICAL REVIEW, 1955, 99 (04) :1151-1155

[9]

Gupta K.C., 1979, MICROSTRIP LINES SLO

[10] FROM APPROXIMATIONS TO EXACT RELATIONS FOR CHARACTERISTIC IMPEDANCES [J].

HILBERG, W .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1969, MT17 (05) :259-&

← 1 2 3 →