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- [25] APPLICATIONS OF AUGER-ELECTRON SPECTROSCOPY AND SECONDARY ION MASS-SPECTROSCOPY IN SOLAR-ENERGY RESEARCH TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY, 1979, 33 (NOV): : 245 - 246
- [26] DEPTH PROFILE ANALYSIS OF HYDROGENATED CARBON LAYERS ON SILICON BY X-RAY PHOTOELECTRON-SPECTROSCOPY, AUGER-ELECTRON SPECTROSCOPY, ELECTRON ENERGY-LOSS SPECTROSCOPY, AND SECONDARY ION MASS-SPECTROMETRY JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04): : 1470 - 1473
- [27] AN AUGER-ELECTRON SPECTROSCOPY, X-RAY PHOTOELECTRON-SPECTROSCOPY, SECONDARY ION MASS-SPECTROMETRY AND BULK ANALYSIS OF PYROLYTIC BORON-NITRIDE CRUCIBLES AFTER VACUUM BAKING JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (06): : 1310 - 1315