ROUGHNESS FORM AND WAVINESS MEASUREMENT BY MEANS OF LIGHT-SCATTERING

This paper deals with a non-contact, optical measuring method which unites the assessment of roughness form and waviness in one single instrument. The method is based on the deflection of light which leads to a more or less broad scattered light distribution in the case of roughness and to a shift of the total distribution curve due to waviness structures. The evaluation of the roughness signals yields the well-known optical scattering value S//N. This value correlates generally with the profile angle parameter D//q and, in special cases, with the R//z value. The optical measured form and waviness leads, after a calculation, directly to the geometrical profile which can be compared with a mechanically traced profile.