HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF 60-DEGREES-DISLOCATIONS IN CU

Dissociated 60 degrees-dislocations in Cu are imaged by high-resolution transmission electron microscopy (HRTEM). From the separation of the partial dislocations a room-temperature stacking-fault free energy (SFE) of(40 +/- 8) mJ/m(2) is deduced. This value corresponds well to the results obtained by the weak-beam technique, in which thicker specimen foils are used. Considered together with results on other materials, this indicates that the determination of the SFE by HRTEM is possible if the SFE is not extremely low and if 60''-dislocations are used for the analysis.