共 50 条
- [1] DETECTION OF POINT-DEFECT INHOMOGENEITIES IN III-V SEMICONDUCTORS BY SCANNING-DLTS PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1986, 94 (01): : K21 - K24
- [2] OPTICAL INVESTIGATIONS OF SURFACE AND INTERFACE PROPERTIES AT III-V SEMICONDUCTORS MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1991, 9 (1-3): : 31 - 35
- [3] EPITAXY OF SEMICONDUCTORS III-V VIDE-SCIENCE TECHNIQUE ET APPLICATIONS, 1985, 40 (225): : 33 - 45
- [7] APPLICATIONS OF SCANNING AUGER MICROSCOPY FOR INTERFACE STUDIES IN III-V SEMICONDUCTORS SCANNING ELECTRON MICROSCOPY, 1985, 1985 : 1465 - 1476
- [8] Microwave III-V semiconductors for telecommunications and prospective of the III-V industry PROCEEDING OF THE 2002 3RD INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, 2002, : 223 - 223
- [9] ORIGIN OF THE INDUCED CURRENT IN THE III-V SEMICONDUCTORS IN SCANNING ELECTRON-MICROSCOPY JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1981, 6 (01): : 37 - 38