DIRECT IMPRINTING OF SiO2 WAVEGUIDE STRUCTURES ON GaAs AND ITS APPLICATION IN InAs/GaAs QUANTUM DOT INTERMIXING

被引:0
|
作者
Chia, C. K. [1 ]
Suryana, M. [1 ]
Zhao, W. [1 ]
Low, H. Y. [1 ]
Hopkinson, M. [2 ]
机构
[1] ASTAR, Inst Mat Res & Engn, 3 Res Link, Singapore 117602, Singapore
[2] Univ Sheffield, Dept Elect & Elect Engn, Sheffield S1 3JD, S Yorkshire, England
关键词
Imprinting; quantum dot; waveguide devices; intermixing; molecular-beam epitaxy;
D O I
10.1142/S0219581X09005839
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A novel approach for intermixing of InAs/GaAs quantum dot (QD) structure by direct imprinting of SiO2 strips using silicafilm is presented. The silicafilm SiO2 strips were imprinted on a InAs/GaAs QD structure by an Obducat nanoimprinter using a polyethylene terepthalate soft mold. Inductively coupled plasma etching of GaAs waveguide structures using the imprinted SiO2 strips as hard mask has been demonstrated. By using the silicafilm SiO2 as a capping layer, the effects of impurity-free vacancy disordering intermixing on optical characteristics of the InAs/GaAs QD structure have been examined. The measured photoluminescence spectra of the InAs/GaAs QD structure suggest that differential wavelength blueshift of up to 105 nm for region with and without the SiO2 film can be achieved. A cost effective one step SiO2 hard mask with graded thickness profile for quantum well or QD intermixing by imprinting technique is proposed for application in broadband lasers and superluminescent diodes.
引用
收藏
页码:107 / 111
页数:5
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