SIMULATION OF X-RAY-DIFFRACTION FOR SUPERLATTICES WITH FLUCTUATIONS FROM PERFECT PERIODICITY

被引:5
作者
XIU, LS
WU, ZQ
机构
[1] Fundamental Physics Center, University of Science and Technology of China
关键词
D O I
10.1063/1.350635
中图分类号
O59 [应用物理学];
学科分类号
摘要
An investigation on the effects of the disorder of superlattice periods on x-ray-diffraction patterns is reported. Three kinds of disorder (random fluctuations, systematic deviations, and local deviations) have been considered. The results of the simulations show that their effects are quite different. The systematic deviation widens the superlattice peaks and shifts the positions of the low-angle superlattice peaks. The effect of the systematic deviation on the reduction of peak intensity is more serious than that of random fluctuation. The local deviation makes the superlattice peak weaker and wider or splits it into double peaks. These three kinds of disorder can be distinguished.
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页码:4892 / 4896
页数:5
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共 19 条
[11]   DETERMINATION OF LATTICE-CONSTANT OF EPITAXIAL LAYERS OF III-V COMPOUNDS [J].
HORNSTRA, J ;
BARTELS, WJ .
JOURNAL OF CRYSTAL GROWTH, 1978, 44 (05) :513-517
[12]  
HUANG PC, 1990, ADV XRAY ANAL, V33, P67
[13]  
JIANG ZM, 1989, 12TH P INT C XRAY OP, P213
[14]   AN X-RAY-DIFFRACTION STUDY ON ARTIFICIAL MULTILAYERED STRUCTURE [J].
LIU, W ;
JIANG, XM ;
XU, C ;
WU, ZQ .
SOLID STATE COMMUNICATIONS, 1988, 65 (01) :1-5
[15]   X-RAY-DIFFRACTION STUDY OF A ONE-DIMENSIONAL GAAS-ALAS SUPERLATTICE [J].
SEGMULLER, A ;
KRISHNA, P ;
ESAKI, L .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (FEB1) :1-6
[16]   X-RAY ROCKING CURVE ANALYSIS OF SUPERLATTICES [J].
SPERIOSU, VS ;
VREELAND, T .
JOURNAL OF APPLIED PHYSICS, 1984, 56 (06) :1591-1600
[17]   HIGH-RESOLUTION DOUBLE-CRYSTAL X-RAY-DIFFRACTION FOR IMPROVED ASSESSMENT OF MODULATED SEMICONDUCTOR STRUCTURES [J].
TAPFER, L ;
STOLZ, W ;
FISCHER, A ;
PLOOG, K .
SURFACE SCIENCE, 1986, 174 (1-3) :88-93
[18]   OPTICAL SPECTROSCOPY OF PURPOSELY DISORDERED GAAS/ALGAAS SUPERLATTICES [J].
TUNCEL, E ;
PAVESI, L ;
REINHART, FK .
SUPERLATTICES AND MICROSTRUCTURES, 1989, 5 (03) :327-330
[19]   DYNAMIC X-RAY-DIFFRACTION FROM NONUNIFORM CRYSTALLINE FILMS - APPLICATION TO X-RAY ROCKING CURVE ANALYSIS [J].
WIE, CR ;
TOMBRELLO, TA ;
VREELAND, T .
JOURNAL OF APPLIED PHYSICS, 1986, 59 (11) :3743-3746