THE EFFECT OF AMORPHOUS SURFACE-LAYERS ON IMAGES OF CRYSTALS IN HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

被引：20

作者：

KILAAS, R

GRONSKY, R

机构：

[1] Lawrence Berkeley Lab, Natl Cent for, Electron Microscopy, Berkeley, CA,, USA, Lawrence Berkeley Lab, Natl Cent for Electron Microscopy, Berkeley, CA, USA

来源：

ULTRAMICROSCOPY | 1985年 / 16卷 / 02期

关键词：

All Open Access; Green;

D O I：

10.1016/0304-3991(85)90073-7

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

CRYSTALS

引用

页码：193 / 201

页数：9

共 8 条

[1]

[Anonymous], COMMUNICATION

[2]

ANSTIS GR, 1983, I PHYS C SER, V68, P169

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BELL, RJ ;

DEAN, P .

PHILOSOPHICAL MAGAZINE, 1972, 25 (06) :1381-&

[4]

BOLLMANN W, 1975, CRYSTAL DEFECTS CRYS, P215

[5]

BOURRET A, 1981, I PHYS C SER, V60, P9

[6] REAL SPACE IMAGE SIMULATION IN HIGH-RESOLUTION ELECTRON-MICROSCOPY [J].

KILAAS, R ;

GRONSKY, R .

ULTRAMICROSCOPY, 1983, 11 (04) :289-298

[7]

KRAKOW W, 1981, I PHYS C SER, V61, P365

[8]

MAZUR JH, 1983, I PHYS C SER, V67, P77

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