CHARGING CONTROL USING PULSED SCANNING ELECTRON-MICROSCOPY

被引:0
作者
WONG, WK
PHANG, JCH
THONG, JTL
机构
关键词
CHARGING CONTROL; HIGH-VOLTAGE SEM; BEAM PULSING; IMAGE PROCESSING;
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This paper describes a novel method to observe highly charging specimens at high-beam voltages without specimen preparation. It is found that the technique greatly reduces charging artifacts such as image shift, astigmatism, and defocussing without sacrificing image quality. Images obtained of uncoated specimens are found to be comparable to gold-coated specimens and without exhibiting charging effects. The technique also allows the study of charge distribution effects in specimen charging of which very little understanding exists, particularly as far as the spatial and time dependent properties of charging are concerned.
引用
收藏
页码:312 / 315
页数:4
相关论文
共 50 条
[41]   Dough microstructure: Novel analysis by quantification using confocal laser scanning microscopy [J].
Jekle, M. ;
Becker, T. .
FOOD RESEARCH INTERNATIONAL, 2011, 44 (04) :984-991
[42]   Evaluation of Yogurt Microstructure Using Confocal Laser Scanning Microscopy and Image Analysis [J].
Skytte, Jacob L. ;
Ghita, Ovidiu ;
Whelan, Paul F. ;
Andersen, Ulf ;
Moller, Flemming ;
Dahl, Anders B. ;
Larsen, Rasmus .
JOURNAL OF FOOD SCIENCE, 2015, 80 (06) :E1218-E1228
[43]   No -Reference Quality Assessment Method of Evaluating Scanning Electron Microscopy Images Based on Multi -Scale Characteristics [J].
Li Qiaoyue ;
Shang Gangcheng ;
Tian Qiang ;
Chen Xi ;
Han Xixi ;
Zhou Yu ;
Li Leida .
LASER & OPTOELECTRONICS PROGRESS, 2018, 55 (11)
[44]   Correlative Fractography: Combining Scanning Electron Microscopy and Light Microscopes for Qualitative and Quantitative Analysis of Fracture Surfaces [J].
de Oliveira Hein, Luis Rogerio ;
de Oliveira, Jose Alberto ;
de Campos, Kamila Amato .
MICROSCOPY AND MICROANALYSIS, 2013, 19 (02) :496-500
[45]   Ciliary count in chronic suppurative otitis media: comparative quantitative study between mucosal and squamous types using scanning electron microscopy and image analysis [J].
Atef, A ;
Ayad, EE .
JOURNAL OF LARYNGOLOGY AND OTOLOGY, 2004, 118 (05) :343-347
[46]   HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SHORT-RANGE ORDERED STRUCTURE OF GA0.5IN0.5P [J].
SHINDO, D ;
HIRAGA, K ;
IIJIMA, S ;
KUDOH, J ;
NEMOTO, Y ;
OIKAWA, T .
JOURNAL OF ELECTRON MICROSCOPY, 1993, 42 (04) :227-230
[47]   A stitching algorithm for measuring large areas using scanning electron microscopes [J].
Won-Pyo Hong ;
Seok-Woo Lee ;
Hon-Zong Choi .
International Journal of Precision Engineering and Manufacturing, 2013, 14 :147-151
[48]   A Stitching Algorithm for Measuring Large Areas Using Scanning Electron Microscopes [J].
Hong, Won-Pyo ;
Lee, Seok-Woo ;
Choi, Hon-Zong .
INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, 2013, 14 (01) :147-151
[49]   Scale dependence of textural alignment in shales quantified using electron microscopy [J].
Kaduri, Maor ;
Dor, Maoz ;
Day-Stirrat, Ruarri J. ;
Emmanuel, Simon .
MARINE AND PETROLEUM GEOLOGY, 2020, 122
[50]   Quantitative analysis of structural inhomogeneity in nanomaterials using transmission electron microscopy [J].
Klinger, Miloslav ;
Polivka, Leos ;
Jager, Ales ;
Tyunina, Marina .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2016, 49 :762-770