EVANESCENT-FIELD OPTICAL MICROSCOPY - EFFECTS OF POLARIZATION, TIP SHAPE AND RADIATIVE WAVES

被引:39
作者
VANHULST, NF
SEGERINK, FB
ACHTEN, F
BOLGER, B
机构
[1] Opto-electronics, Applied Physics, University of Twente, 7500 AE Enschede
关键词
D O I
10.1016/0304-3991(92)90301-Y
中图分类号
TH742 [显微镜];
学科分类号
摘要
Recent results in evanescent-field optical microscopy are presented. A resolution of 30 nm in the lateral directions and 0.1 nm in height has been obtained by suitable tip fabrication. Both the direction of the exciting field and the tip shape are shown to affect the optical coupling efficiency and resolution. Near-field diffraction patterns are observed with high lateral resolution by interference between evanescent and propagating waves.
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收藏
页码:416 / 421
页数:6
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