X-RAY STRUCTURAL-ANALYSIS OF DISLOCATION-STRUCTURES IN POLYCRYSTALS BY DISTRIBUTIONS OF MICRODEFORMATIONS

被引:0
|
作者
SELIVANOV, VN
SMYSLOV, EF
机构
来源
INDUSTRIAL LABORATORY | 1994年 / 60卷 / 02期
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中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Analytical expressions have been derived, which correlate the parameters of the dislocation structure with microdeformations of the crystal lattice and the index of the degree of their distribution thus permitting quantitative estimates of the dislocation density and the degree of correlation in the dislocation A method for using the obtained relationships within the framework of Fourier analysis and approximation methods is proposed. Examples of analysis of the dislocation structure are given for a number of and the proposed method is demonstrated to be effective for estimating dislocation structure Parameters on the basis of analysis of distributions of microdeformatiOns by comparison with the results obtained by other methods, in particular, by transmission electron microscopy.
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页码:110 / 114
页数:5
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