ROUND ROBIN STUDY OF IMPURITY ANALYSIS IN GALLIUM-ARSENIDE USING SECONDARY ION MASS-SPECTROMETRY

被引:28
作者
HOMMA, Y
KUROSAWA, S
YOSHIOKA, Y
SHIBATA, M
NOMURA, K
NAKAMURA, Y
机构
[1] MATSUSHITA TECHNORES INC, MORIGUCHI, OSAKA 570, JAPAN
[2] SUMITOMO ELECT IND LTD, RES & DEV GRP, OSAKA 554, JAPAN
[3] MITSUBISHI MET CORP, CENT RES INST, OMIYA, SAITAMA 330, JAPAN
[4] NIPPON MIN CORP, CENT RES LABS, TODA, SAITAMA 335, JAPAN
关键词
D O I
10.1021/ac00291a041
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
收藏
页码:2928 / 2934
页数:7
相关论文
共 50 条
[41]   THE ANALYSIS OF OXYGEN IN THE MATERIALS BY THE SECONDARY ION MASS-SPECTROMETRY [J].
LEEFATOU, AV ;
DOROZHKIN, AA ;
KOVARSKY, AP .
RADIOTEKHNIKA I ELEKTRONIKA, 1992, 37 (10) :1870-1874
[42]   SECONDARY ION MASS-SPECTROMETRY IN THE STUDY OF LANTHANIDE COMPOUNDS [J].
DAOLIO, S ;
FACCHIN, B ;
PAGURA, C ;
GUERRIERO, P ;
SITRAN, S ;
VIGATO, PA .
INORGANICA CHIMICA ACTA, 1990, 178 (01) :131-137
[43]   SECONDARY ION MASS-SPECTROMETRY IN THE STUDY OF BIOMINERALIZATIONS AND BIOMATERIALS [J].
LODDING, AR ;
FISCHER, PM ;
ODELIUS, H ;
NOREN, JG ;
SENNERBY, L ;
JOHANSSON, CB ;
CHABALA, JM ;
LEVISETTI, R .
ANALYTICA CHIMICA ACTA, 1990, 241 (02) :299-314
[44]   ION NEUTRALIZATION IN SECONDARY ION MASS-SPECTROMETRY [J].
GARRETT, RF ;
MACDONALD, RJ ;
OCONNOR, DJ .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3) :333-335
[45]   DETERMINATION OF CARBON IMPURITY IN GALLIUM-ARSENIDE CRYSTALS BY PHOTON-ACTIVATION ANALYSIS [J].
YOSHIOKA, A ;
NOMURA, K ;
KAWAKAMI, O ;
SHIMURA, K ;
MASUMOTO, K ;
YAGI, M .
JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY-ARTICLES, 1991, 148 (02) :201-209
[46]   SECONDARY ION MASS-SPECTROMETRY (SIMS) [J].
SHINODA, G .
JOURNAL OF ELECTRON MICROSCOPY, 1975, 24 (01) :57-58
[47]   SECONDARY ION MASS-SPECTROMETRY (SIMS) [J].
ODAWARA, O .
DENKI KAGAKU, 1990, 58 (03) :211-217
[48]   QUANTITATIVE SECONDARY ION MASS-SPECTROMETRY [J].
GRASSERBAUER, M .
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1988, 93 (03) :510-518
[49]   QUADRUPOLES FOR SECONDARY ION MASS-SPECTROMETRY [J].
DAWSON, PH .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1975, 17 (04) :447-467
[50]   SECONDARY ION MASS-SPECTROMETRY OF SEMICONDUCTORS [J].
WILSON, RG .
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 463 :86-87