共 50 条
[31]
INDIVIDUAL ANALYSIS OF NONMETALLIC INCLUSIONS IN STEEL BY USING THE GALLIUM FOCUSED ION-BEAM SECONDARY-ION MASS-SPECTROMETRY
[J].
TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN,
1995, 81 (10)
:977-982
[33]
LOW-ENERGY ION SCATTERING SPECTROMETRY (ISS) ANALYSIS OF GALLIUM-ARSENIDE ANODIC OXIDE
[J].
REVUE TECHNIQUE THOMSON-CSF,
1978, 10 (03)
:427-443
[36]
SEMICONDUCTOR DOPAND ANALYSIS BY SECONDARY ION MASS-SPECTROMETRY
[J].
TECHNISCHES MESSEN,
1987, 54 (09)
:337-342
[37]
ANALYSIS OF LASER DESORPTION BY SECONDARY ION MASS-SPECTROMETRY
[J].
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS,
1983, 380
:224-231
[38]
PROBLEMS OF THE LAYER ANALYSIS IN SECONDARY ION MASS-SPECTROMETRY
[J].
RADIOTEKHNIKA I ELEKTRONIKA,
1992, 37 (10)
:1863-1869
[39]
TRACE SILVER ANALYSIS BY SECONDARY ION MASS-SPECTROMETRY
[J].
CIM BULLETIN,
1985, 78 (878)
:77-77
[40]
SECONDARY ION MASS-SPECTROMETRY ANALYSIS OF SEMICONDUCTOR LAYERS
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1981, 18 (02)
:301-304