TEMPERATURE-DEPENDENCE OF THE MINORITY-CARRIER LIFETIME IN GAAS/ALGAAS DOUBLE HETEROSTRUCTURES

被引:18
作者
BERGMAN, JP
HALLIN, C
JANZEN, E
机构
[1] Department of Physics and Measurement Technology, Linköping University
关键词
D O I
10.1063/1.360740
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have studied the photoluminescence decay time in a series of high quality GaAs/AlGaAs double heterostructure samples, grown by liquid phase epitaxy, with different p-type doping. We have compared the experimentally observed decay time as a function of temperature from 100 to 700 K, with a complete calculation of the radiative recombination rate, including the temperature dependence of the reabsorption factor. We conclude that the observed decay time is well explained by a dominating radiative recombination up to temperatures of about 500 K. The internal quantum efficiency is hence close to unity. At higher temperatures we observe a deviation from the expected values for the radiative recombination, attributed to a nonradiative recombination channel. (C) 1995 American Institute of Physics.
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页码:4808 / 4810
页数:3
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