TIP SAMPLE FORCES IN SCANNING PROBE MICROSCOPY IN AIR AND VACUUM

被引：79

作者：

GRIGG, DA ^{[1
]}

RUSSELL, PE ^{[1
]}

GRIFFITH, JE ^{[1
]}

机构：

[1] AT&T BELL LABS, MURRAY HILL, NJ 07974 USA

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 1992年 / 10卷 / 04期

关键词：

D O I：

10.1116/1.577709

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Forces between a probe and sample have been measured in air and vacuum using a rocking beam force balance sensor capable of simultaneously obtaining both force and tunneling topographs. Force versus distance curve measurements demonstrate the effects of capillary forces in air but not in vacuum. Simultaneous scanning tunneling microscope (STM) imaging and force measurement in air show spatial force variations consistent with repulsive force tunneling. Our results support observations of large repulsive forces in STM occurring from surface contaminants. These results show how forces can affect image formation in both STM and scanning force microscopy.

引用

页码：680 / 683

页数：4

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