SURVEY OF DOPANTS IN SILICON FOR 2-2.7 AND 3-5 MUM INFRARED DETECTOR APPLICATION

被引：31

作者：

SCLAR, N ^{[1
]}

机构：

[1] ROCKWELL INT,ANAHEIM,CA 92803

来源：

INFRARED PHYSICS | 1977年 / 17卷 / 01期

关键词：

D O I：

10.1016/0020-0891(77)90098-7

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：71 / 82

页数：12

共 9 条

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[7] BERYLLIUM AS AN ACCEPTOR IN SILICON [J].

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[8] EXTRINSIC SILICON DETECTORS FOR 3-5 AND 8-14 MUM [J].

SCLAR, N .

INFRARED PHYSICS, 1976, 16 (04) :435-448

[9]

SCLAR N, TO BE PUBLISHED

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