RAPID WRITING OF FINE LINES IN LANGMUIR-BLODGETT FILMS USING ELECTRON-BEAMS

被引：48

作者：

BROERS, AN ^{[1
]}

POMERANTZ, M ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

THIN SOLID FILMS | 1983年 / 99卷 / 1-3期

关键词：

D O I：

10.1016/0040-6090(83)90399-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：323 / 329

页数：7

共 15 条

[1]

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[2]

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[4]

BROERS AN, 1976, APPL PHYS LETT, V15, P98

[5]

BROERS AN, 1978, 9TH P INT C EL MICR, V3, P343

[6] PHASE-SLIP AND LOCALIZATION DIFFUSION LENGTHS IN AMORPHOUS W-RE ALLOYS [J].

CHAUDHARI, P ;

BROERS, AN ;

CHI, CC ;

LAIBOWITZ, R ;

SPILLER, E ;

VIGGIANO, J .

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[7] ALIGNMENT OF LIQUID-CRYSTALS USING SUBMICROMETER PERIODICITY GRATINGS [J].

FLANDERS, DC ;

SHAVER, DC ;

SMITH, HI .

APPLIED PHYSICS LETTERS, 1978, 32 (10) :597-598

[8] CRYSTALLOGRAPHIC ORIENTATION OF SILICON ON AN AMORPHOUS SUBSTRATE USING AN ARTIFICIAL SURFACE-RELIEF GRATING AND LASER CRYSTALLIZATION [J].

GEIS, MW ;

FLANDERS, DC ;

SMITH, HI .

APPLIED PHYSICS LETTERS, 1979, 35 (01) :71-74

[9] EXPERIMENTAL-STUDY OF ANDERSON LOCALIZATION IN THIN WIRES [J].

GIORDANO, N ;

GILSON, W ;

PROBER, DE .

PHYSICAL REVIEW LETTERS, 1979, 43 (10) :725-728

[10]

KONIG H, 1948, NATURWISSENSCHAFTEN, V35, P261

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