共 11 条
- [1] Burbery A. J., 1986, JEOL News, Electron Optics Instrumentation, V24E, P2
- [2] DISKO MM, 1986, INTERMEDIATE VOLTAGE, P72
- [3] EGERTON RF, 1986, INTERMEDIATE VOLTAGE, P67
- [4] ISAACSON M, 1975, ULTRAMICROSCOPY, V1, P32
- [5] EELS LOG-RATIO TECHNIQUE FOR SPECIMEN-THICKNESS MEASUREMENT IN THE TEM [J]. JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1988, 8 (02): : 193 - 200
- [6] SEVELY J, 1987, SCANNING MICROSCOP S, V1, P179
- [8] UNSER M, 1987, J MICROSC-OXFORD, V145, P245
- [9] [No title captured]
- [10] [No title captured]