STRUCTURE-RELATED OPTICAL CHARACTERISTICS OF THIN METALLIC-FILMS IN VISIBLE AND ULTRAVIOLET

被引:18
作者
BENNETT, HE [1 ]
STANFORD, JL [1 ]
机构
[1] USN, CTR WEAP, MICHELSON LABS, CHINA LAKE, CA 93555 USA
来源
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY | 1976年 / 80卷 / 04期
关键词
D O I
10.6028/jres.080A.064
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
收藏
页码:643 / 658
页数:16
相关论文
共 39 条
[1]  
[Anonymous], COMMUNICATION
[2]  
Bennet H.E., 1967, PHYS THIN FILMS, V4, P1
[3]   PRECISION MEASUREMENT OF ABSOLUTE SPECULAR REFLECTANCE WITH MINIMIZED SYSTEMATIC ERRORS [J].
BENNETT, HE ;
KOEHLER, WF .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (01) :1-6
[4]   VERIFICATION OF ANOMALOUS-SKIN-EFFECT THEORY FOR SILVER IN INFRARED [J].
BENNETT, HE ;
BENNETT, JM ;
ASHLEY, EJ ;
MOTYKA, RJ .
PHYSICAL REVIEW, 1968, 165 (03) :755-&
[5]   RELATION BETWEEN SURFACE ROUGHNESS AND SPECULAR REFLECTANCE AT NORMAL INCIDENCE [J].
BENNETT, HE ;
PORTEUS, JO .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1961, 51 (02) :123-+
[6]   ACCURATE METHOD FOR DETERMINING PHOTOMETRIC LINEARITY [J].
BENNETT, HE .
APPLIED OPTICS, 1966, 5 (08) :1265-+
[7]  
BENNETT HE, 1974, SPACE OPTICS, P717
[8]  
BENNETT HE, 1965, S THERMAL RADIATION, P145
[9]   OPTICAL CONSTANTS OF SILVER SULFIDE TARNISH FILMS [J].
BENNETT, JM ;
STANFORD, JL ;
ASHLEY, EJ .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1970, 60 (02) :224-&
[10]   USE OF AN EVAPORATED DIELECTRIC FILM FOR DETERMINING OPTICAL CONSTANTS OF A METAL .I. [J].
BENNETT, JM ;
ASHLEY, EJ ;
BENNETT, HE .
APPLIED OPTICS, 1965, 4 (08) :961-&