共 55 条
[3]
INVESTIGATION OF EFFECTIVE-MEDIUM MODELS OF MICROSCOPIC SURFACE-ROUGHNESS BY SPECTROSCOPIC ELLIPSOMETRY
[J].
PHYSICAL REVIEW B,
1979, 20 (08)
:3292-3302
[4]
DIELECTRIC-PROPERTIES OF HEAVILY DOPED CRYSTALLINE AND AMORPHOUS-SILICON FROM 1.5 TO 6.0 EV
[J].
PHYSICAL REVIEW B,
1984, 29 (02)
:768-779
[8]
ANISOTROPIC ETCHING OF SILICON
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1978, 25 (10)
:1185-1193
[9]
Bendere R. B., 1982, Optics and Spectroscopy, V53, P299
[10]
BENDERE RB, 1982, OPT SPEKTROSK+, V53, P507