ELECTRODE EROSION UNDER HIGH-CURRENT VACUUM ARCS

被引：0
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作者：
ZOU, JY
CHENG, LC
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ELECTRICAL CONTACTS - 1989 | 1989年
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码：253 / 255
页数：3
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