USE OF SYNCHROTRON RADIATION SOURCES FOR X-RAY-DIFFRACTION TOPOGRAPHY OF POLYTYPIC STRUCTURES

被引：18

作者：

FISHER, GR ^{[1
]}

BARNES, P ^{[1
]}

机构：

[1] UNIV LONDON BIRKBECK COLL,DEPT CRYSTALLOG,LONDON WC1E 7HX,ENGLAND

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1984年 / 17卷 / AUG期

关键词：

ACCELERATORS; SYNCHROTRON;

D O I：

10.1107/S0021889884011432

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The potential of synchrotron radiation sources (SRS) for the topography of polytypic structures has been assessed. It has been found that the white radiation and low divergence characteristics of the SRS are uniquely suitable for accommodating the complications of mixed polytypes, heavily distorted crystals and edge-reflection topography. Computer aids are particularly important for separating contributions from mixed polytype crystals. All these techniques are illustrated using silicon carbide as a prototype polytypic crystal.

引用

页码：231 / 237

页数：7

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