DETERMINATION OF TRACE-METALS IN HIGH-PURITY SILICA, SILICON-NITRIDE AND SILICON-CARBIDE BY ICP-AES AFTER SEPARATION WITH MINICOLUMN CHELATING RESIN

被引：0

作者：

YOSHIKAWA, H ^{[1
]}

ISHIBASHI, Y ^{[1
]}

GUNJI, N ^{[1
]}

SASAYAMA, K ^{[1
]}

MISUMI, T ^{[1
]}

机构：

[1] KOKAN KEISOKU CORP,DIV CHEM ENGN,KAWASAKI KU,KAWASAKI,KANAGAWA 210,JAPAN

来源：

BUNSEKI KAGAKU | 1990年 / 39卷 / 06期

关键词：

D O I：

暂无

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：T83 / T87

页数：5

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