DETERMINATION OF TRACE-METALS IN HIGH-PURITY SILICA, SILICON-NITRIDE AND SILICON-CARBIDE BY ICP-AES AFTER SEPARATION WITH MINICOLUMN CHELATING RESIN

被引：0
|
作者：
YOSHIKAWA, H [1 ]
ISHIBASHI, Y [1 ]
GUNJI, N [1 ]
SASAYAMA, K [1 ]
MISUMI, T [1 ]
机构：
[1] KOKAN KEISOKU CORP,DIV CHEM ENGN,KAWASAKI KU,KAWASAKI,KANAGAWA 210,JAPAN
来源：
BUNSEKI KAGAKU | 1990年 / 39卷 / 06期
关键词：
D O I：
暂无
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：T83 / T87
页数：5
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