DIELECTRIC-PROPERTIES OF HEAVILY DOPED CRYSTALLINE AND AMORPHOUS-SILICON FROM 1.5 TO 6.0 EV

被引:301
作者
ASPNES, DE
STUDNA, AA
KINSBRON, E
机构
来源
PHYSICAL REVIEW B | 1984年 / 29卷 / 02期
关键词
D O I
10.1103/PhysRevB.29.768
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:768 / 779
页数:12
相关论文
共 48 条
[1]  
ADAMS AC, 1982, Patent No. 4357179
[2]   THEORY OF TEMPERATURE-DEPENDENCE OF ELECTRONIC BAND STRUCTURES [J].
ALLEN, PB ;
HEINE, V .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1976, 9 (12) :2305-2312
[3]   SOLIDS WITH THERMAL OR STATIC DISORDER .1. ONE-ELECTRON PROPERTIES [J].
ALLEN, PB .
PHYSICAL REVIEW B, 1978, 18 (10) :5217-5224
[4]   OPTICAL-PROPERTIES OF GAAS AND ITS ELECTROCHEMICALLY GROWN ANODIC OXIDE FROM 1.5 TO 6.0 EV [J].
ASPNES, DE ;
SCHWARTZ, GP ;
GUALTIERI, GJ ;
STUDNA, AA ;
SCHWARTZ, B .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (03) :590-597
[5]   CHEMICAL ETCHING AND CLEANING PROCEDURES FOR SI, GE, AND SOME III-V COMPOUND SEMICONDUCTORS [J].
ASPNES, DE ;
STUDNA, AA .
APPLIED PHYSICS LETTERS, 1981, 39 (04) :316-318
[6]   HIGH PRECISION SCANNING ELLIPSOMETER [J].
ASPNES, DE ;
STUDNA, AA .
APPLIED OPTICS, 1975, 14 (01) :220-228
[7]   OPTICAL-PROPERTIES OF THIN-FILMS [J].
ASPNES, DE .
THIN SOLID FILMS, 1982, 89 (03) :249-262
[8]   DIELECTRIC FUNCTIONS AND OPTICAL-PARAMETERS OF SI, GE, GAP, GAAS, GASB, INP, INAS, AND INSB FROM 1.5 TO 6.0 EV [J].
ASPNES, DE ;
STUDNA, AA .
PHYSICAL REVIEW B, 1983, 27 (02) :985-1009
[9]   SURFACE TRANSITION REGIONS AND VISIBLE-NEAR UV OPTICAL-PROPERTIES OF SOME SEMICONDUCTORS [J].
ASPNES, DE .
PHYSICA B & C, 1983, 117 (MAR) :359-361
[10]   THE ANALYSIS OF OPTICAL-SPECTRA BY FOURIER METHODS [J].
ASPNES, DE .
SURFACE SCIENCE, 1983, 135 (1-3) :284-306