SOME APPLICATIONS OF FIELD-IONIZATION AND FIELD-EVAPORATION TECHNIQUES IN STUDY OF SURFACES

被引:23
作者
SOUTHON, MJ [1 ]
BOYES, ED [1 ]
TURNER, PJ [1 ]
WAUGH, AR [1 ]
机构
[1] UNIV CAMBRIDGE,DEPT MET & MAT SCI,CAMBRIDGE CB2 3QZ,ENGLAND
关键词
D O I
10.1016/0039-6028(75)90154-5
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:554 / 580
页数:27
相关论文
共 34 条
[1]  
Bowkett K. M., 1970, FIELD ION MICROSCOPY
[2]   TECHNIQUES FOR FIELD-ION MICROSCOPY OF COPPER, GOLD AND ALUMINUM [J].
BOYES, ED ;
SOUTHON, MJ .
VACUUM, 1972, 22 (10) :447-451
[3]   CONSTRUCTION AND PERFORMANCE OF AN FIM-ATOM PROBE [J].
BRENNER, SS ;
MCKINNEY, JT .
SURFACE SCIENCE, 1970, 23 (01) :88-&
[4]  
CHERNATONY LD, TO BE PUBLISHED
[5]   Electron emission in intense electric fields [J].
Fowler, RH ;
Nordheim, L .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-CONTAINING PAPERS OF A MATHEMATICAL AND PHYSICAL CHARACTER, 1928, 119 (781) :173-181
[6]   FIELD-EMISSION ENERGY-DISTRIBUTION (FEED) [J].
GADZUK, JW ;
PLUMMER, EW .
REVIEWS OF MODERN PHYSICS, 1973, 45 (03) :487-548
[7]  
Gomer R., 1961, FIELD EMISSION FIELD
[8]  
Good RH., 1956, FIELD EMISSION, P176
[9]   FIELD-ION MICROSCOPY OF INTERPHASE INTERFACES .2. EXPERIMENTAL [J].
HILDON, A ;
HOWELL, PR ;
YOULE, A ;
TAUNT, RJ ;
PAGE, TF ;
RALPH, B .
JOURNAL OF MICROSCOPY-OXFORD, 1973, 99 (SEP) :41-56
[10]  
HOCHMAN RF, 1969, APPLICATIONS FIELD I