ACCURATE LATTICE-CONSTANTS FROM MULTIPLE DIFFRACTION MEASUREMENTS .1. GEOMETRY, TECHNIQUES AND SYSTEMATIC-ERRORS

被引：44
作者：
POST, B [1 ]
机构：
[1] POLYTECH INST NEW YORK,BROOKLYN,NY 11201
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1975年 / 8卷 / AUG1期
关键词：
D O I：
10.1107/S0021889875010953
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：452 / 456
页数：5
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