ASSESSMENT OF RANDOM AND SYSTEMATIC-ERRORS IN MICROWAVE AND SUBMILLIMETER DIELECTRIC MEASUREMENTS

被引：13
作者：
AFSAR, MN
CHAMBERLAIN, J
CHANTRY, GW
FINSY, R
VANLOON, R
机构：
[1] NATL PHYS LAB,TEDDINGTON TW11 OLW,MIDDLESEX,ENGLAND
[2] FREE UNIV BRUSSELS,FAC SCI,B-1050 BRUSSELS,BELGIUM
来源：
PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON | 1977年 / 124卷 / 06期
关键词：
D O I：
10.1049/piee.1977.0121
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：575 / 577
页数：3
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