MODEL FOR ANALYSIS OF ELECTRON-OPTICAL PROPERTIES OF ELECTRON-MICROSCOPE GUN

被引：0
|
作者：
SHIMOYAMA, H
OHSHITA, A
MARUSE, S
OHYE, T
机构：
[1] NAGOYA UNIV,FAC ENGN,DEPT ELECTR,NAGOYA,JAPAN
[2] MEIJO UNIV,FAC ENGN,DEPT ELECT ENGN,NAGOYA,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1975年 / 24卷 / 03期
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：179 / 179
页数：1
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