共 50 条
[21]
SPECTROSCOPIC ELLIPSOMETRY FOR CHARACTERIZATION OF THIN-FILM STRUCTURES
[J].
TECHNISCHES MESSEN,
1989, 56 (04)
:149-153
[23]
Innovations in ellipsometry facilitate thin-film analysis
[J].
Laser Focus World,
2008, 11 (76-79)
[24]
In situ ellipsometry studies of temperature-dependent Au thin-film growth
[J].
Thin Solid Films,
1999, 341 (01)
:37-41
[25]
INSITU ELLIPSOMETRY AS A DIAGNOSTIC OF THIN-FILM GROWTH - STUDIES OF AMORPHOUS-CARBON
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1989, 7 (03)
:1378-1385
[27]
Developments in thin-film photovoltaics for space
[J].
CONFERENCE RECORD OF THE TWENTY-EIGHTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2000,
2000,
:1242-1245
[29]
Preface to the special issue on “Recent Developments and New Directions in Thin-Film Flow”
[J].
Journal of Engineering Mathematics,
2012, 73
:1-2