RECENT DEVELOPMENTS IN ELLIPSOMETRY THAT ARE USEFUL FOR THIN-FILM STUDIES

被引:8
作者
KINOSITA, K [1 ]
YAMAMOTO, M [1 ]
机构
[1] GAKUSHUIN UNIV,DEPT PHYS,MEJIRO,TOKYO 171,JAPAN
关键词
D O I
10.1016/0040-6090(76)90477-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:283 / 290
页数:8
相关论文
共 50 条
[11]   ELLIPSOMETRY AND THIN FILM STUDIES [J].
VETURY, R ;
ASHOK, J .
JOURNAL OF SCIENTIFIC & INDUSTRIAL RESEARCH, 1969, 28 (05) :166-&
[12]   STUDIES OF SURFACE, THIN-FILM AND INTERFACE PROPERTIES BY AUTOMATIC SPECTROSCOPIC ELLIPSOMETRY [J].
ASPNES, DE .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (02) :289-295
[13]   Real-time ellipsometry studies of gold thin-film growth [J].
Lee, SN ;
Hong, JG ;
Oh, SG .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1997, 36 (6A) :3662-3668
[14]   Overview of recent developments in organic thin-film transistor sensor technology [J].
Tanese, M. C. ;
Marinelli, F. ;
Angione, D. ;
Torsi, L. .
NUOVO CIMENTO C-COLLOQUIA AND COMMUNICATIONS IN PHYSICS, 2008, 31 (04) :457-473
[15]   Innovations in ellipsometry facilitate thin-film analysis [J].
Teboul, Eric .
LASER FOCUS WORLD, 2008, 44 (11) :76-79
[16]   PHASE CONVENTIONS IN THIN-FILM OPTICS AND ELLIPSOMETRY [J].
SPILLER, E .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1983, 73 (12) :1870-1870
[17]   ELLIPSOMETRY FOR THIN-FILM AND SURFACE-ANALYSIS [J].
COLLINS, RW ;
KIM, YT .
ANALYTICAL CHEMISTRY, 1990, 62 (17) :A887-&
[18]   Overview of recent developments in organic thin-film transistor sensor technology [J].
Tanese, M. C. ;
Marinelli, F. ;
Angione, D. ;
Torsi, L. .
NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA C-COLLOQUIA ON PHYSICS, 2008, 31 (04) :457-473
[19]   SPECTROSCOPIC ELLIPSOMETRY FOR CHARACTERIZATION OF THIN-FILM STRUCTURES [J].
KASPARICK, B ;
STEHLE, JL ;
BERNOUX, F ;
THOMAS, O .
TECHNISCHES MESSEN, 1989, 56 (04) :149-153
[20]   PHASE CONVENTIONS IN THIN-FILM OPTICS AND ELLIPSOMETRY [J].
SPILLER, E .
APPLIED OPTICS, 1984, 23 (18) :3036-3037