RECENT DEVELOPMENTS IN ELLIPSOMETRY THAT ARE USEFUL FOR THIN-FILM STUDIES

被引:8
|
作者
KINOSITA, K [1 ]
YAMAMOTO, M [1 ]
机构
[1] GAKUSHUIN UNIV,DEPT PHYS,MEJIRO,TOKYO 171,JAPAN
关键词
D O I
10.1016/0040-6090(76)90477-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:283 / 290
页数:8
相关论文
共 50 条
  • [11] ELLIPSOMETRY AND THIN FILM STUDIES
    VETURY, R
    ASHOK, J
    JOURNAL OF SCIENTIFIC & INDUSTRIAL RESEARCH, 1969, 28 (05): : 166 - &
  • [12] Real-time ellipsometry studies of gold thin-film growth
    Lee, SN
    Hong, JG
    Oh, SG
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1997, 36 (6A): : 3662 - 3668
  • [13] STUDIES OF SURFACE, THIN-FILM AND INTERFACE PROPERTIES BY AUTOMATIC SPECTROSCOPIC ELLIPSOMETRY
    ASPNES, DE
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (02): : 289 - 295
  • [14] Overview of recent developments in organic thin-film transistor sensor technology
    Tanese, M. C.
    Marinelli, F.
    Angione, D.
    Torsi, L.
    NUOVO CIMENTO C-COLLOQUIA AND COMMUNICATIONS IN PHYSICS, 2008, 31 (04): : 457 - 473
  • [15] Overview of recent developments in organic thin-film transistor sensor technology
    Tanese, M. C.
    Marinelli, F.
    Angione, D.
    Torsi, L.
    NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA C-COLLOQUIA ON PHYSICS, 2008, 31 (04): : 457 - 473
  • [16] Innovations in ellipsometry facilitate thin-film analysis
    Teboul, Eric
    LASER FOCUS WORLD, 2008, 44 (11): : 76 - 79
  • [17] ELLIPSOMETRY FOR THIN-FILM AND SURFACE-ANALYSIS
    COLLINS, RW
    KIM, YT
    ANALYTICAL CHEMISTRY, 1990, 62 (17) : A887 - &
  • [18] PHASE CONVENTIONS IN THIN-FILM OPTICS AND ELLIPSOMETRY
    SPILLER, E
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1983, 73 (12) : 1870 - 1870
  • [19] SPECTROSCOPIC ELLIPSOMETRY FOR CHARACTERIZATION OF THIN-FILM STRUCTURES
    KASPARICK, B
    STEHLE, JL
    BERNOUX, F
    THOMAS, O
    TECHNISCHES MESSEN, 1989, 56 (04): : 149 - 153
  • [20] ELLIPSOMETRY OF A THIN-FILM BETWEEN SIMILAR MEDIA
    LEKNER, J
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1988, 5 (07): : 1041 - 1043