MICROWAVE EMMISSION FROM SUPERCONDUCTING POINT-CONTACTS - [SUPERCONDUCTING DIODES - EFFECT OF CONTACT PRESSURE - VOLTAGE STANDARDS - FUNDAMENTAL CONSTANT (E/H) MEASUREMENT - E]

被引：87
作者：
DAYEM, AH
GRIMES, CC
机构：
来源：
APPLIED PHYSICS LETTERS | 1966年 / 9卷 / 01期
关键词：
D O I：
10.1063/1.1754595
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：47 / &
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