COHERENCE EFFECTS ON HOLOGRAPHIC-INTERFEROMETRY

被引：0
|
作者：
UYEMURA, T [1 ]
YONEMURA, M [1 ]
机构：
[1] UNIV TOKYO,TOKYO,JAPAN
来源：
SMPTE JOURNAL | 1976年 / 85卷 / 01期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：19 / 19
页数：1
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