COHERENCE EFFECTS ON HOLOGRAPHIC-INTERFEROMETRY

被引：0

作者：

UYEMURA, T ^{[1
]}

YONEMURA, M ^{[1
]}

机构：

[1] UNIV TOKYO,TOKYO,JAPAN

来源：

SMPTE JOURNAL | 1976年 / 85卷 / 01期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：19 / 19

页数：1

共 50 条

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