ELECTRON LOCALIZATION IN THIN ANTIMONY FILMS

被引：0
|
作者：
BUTENKO, AV
BUKHSHTAB, EI
KOMNIK, YF
机构：
来源：
FIZIKA NIZKIKH TEMPERATUR | 1983年 / 9卷 / 01期
关键词：
D O I：
暂无
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：100 / 103
页数：4
相关论文
共 50 条
  • [21] WEAK LOCALIZATION AND ELECTRON-SCATTERING IN SILVER THIN-FILMS
    GERSHENZON, ME
    GUBANKOV, VN
    ZHURAVLEV, YE
    JETP LETTERS, 1982, 35 (11) : 576 - 580
  • [22] Disorder-driven localization and electron interactions in BixTeI thin films
    Corbae, Paul
    Taufertshoefer, Nicolai
    Kennedy, Ellis
    Scott, Mary
    Hellman, Frances
    PHYSICAL REVIEW MATERIALS, 2024, 8 (04):
  • [23] STRUCTURAL AND GALVANOMAGNETIC PROPERTIES OF THIN ANTIMONY FILMS
    MOJEJKOKOTLINSKA, K
    SUBOTOWICZ, M
    THIN SOLID FILMS, 1984, 111 (03) : 235 - 248
  • [24] Growth and characterization of bismuth and antimony thin films
    Martinez, A
    Collazo, R
    Berrios, AR
    Ducoudray, GO
    JOURNAL OF CRYSTAL GROWTH, 1997, 174 (1-4) : 845 - 850
  • [25] Conductivity of thin antimony films at low temperatures
    Hermann, BA
    Didschuns, I
    Haier, P
    Kopp, M
    Esser, N
    ReschEsser, U
    Richter, W
    Luders, K
    THIN SOLID FILMS, 1996, 275 (1-2) : 125 - 128
  • [26] Chemically deposited antimony selenide thin films
    Rodríguez-Lazcano, Y
    Peña, Y
    Nair, MTS
    Nair, PK
    MATERIALS FOR ENERGY STORAGE, GENERATION AND TRANSPORT, 2002, 730 : 149 - 154
  • [27] MICRO-CONTOUR OF THIN ANTIMONY FILMS
    DVORSON, AN
    KLIMIN, AI
    ZHURNAL TEKHNICHESKOI FIZIKI, 1976, 46 (09): : 1981 - 1984
  • [28] OPTICAL PROPERTIES OF THIN ANTIMONY SULFIDE FILMS
    RAMANUJAM, R
    VETURY, R
    INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1972, 10 (05) : 356 - +
  • [29] LOCALIZATION AND ELECTRON-ELECTRON INTERACTION EFFECTS IN THIN AU-PD FILMS AND WIRES
    LIN, JJ
    GIORDANO, N
    PHYSICAL REVIEW B, 1987, 35 (02): : 545 - 556
  • [30] LENGTH DEPENDENCE OF LOCALIZATION AND ELECTRON-ELECTRON INTERACTION EFFECTS IN THIN METAL-FILMS
    MASDEN, JT
    GIORDANO, N
    PHYSICAL REVIEW B, 1983, 27 (10): : 6522 - 6525
12345