COMPOUND MODULATED SCATTERER MEASURING SYSTEM

被引：13
作者：
HAJNAL, JV [1 ]
机构：
[1] UNIV BRISTOL,HH WILLS PHYS LAB,BRISTOL BS8 1TL,AVON,ENGLAND
来源：
IEE PROCEEDINGS-H MICROWAVES ANTENNAS AND PROPAGATION | 1987年 / 134卷 / 04期
关键词：
D O I：
10.1049/ip-h-2.1987.0069
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
ELECTRIC MEASURING INSTRUMENTS
引用
收藏
页码：350 / 356
页数：7
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