High-rate deposition of high-quality silicon nitride film at room temperature by quasi-remote plasma chemical vapor deposition

被引:1
|
作者
Suzuki, N [1 ]
Hayashi, S [1 ]
Masu, K [1 ]
Tsubouchi, K [1 ]
机构
[1] TOHOKU UNIV, ELECT COMMUN RES INST, SENDAI, MIYAGI 98077, JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1995年 / 34卷 / 12B期
关键词
SIN; microwave; quasi-remote plasma; plasma CVD;
D O I
10.1143/JJAP.34.6824
中图分类号
O59 [应用物理学];
学科分类号
摘要
High-rate deposition of high-quality SiN films at room temperature has been achieved by quasi-remote plasma chemical vapor deposition method using a cylindrical multislot waveguide. The quasi-remote plasma is defined as the plasma whose density near the substrate is less than 1/10 of that in the densest region. Since the number of incident ions is reduced, the temperature rise of the substrate is suppressed even when the high-density plasma is used. Nitrogen excited by the high-density plasma reacts with monosilane to generate a silicon nitride precursor. The precursor is further excited by many electrons to emit hydrogen atoms. The excited precursor is adsorbed on the substrate surface and the silicon nitride film with low hydrogen content is deposited even at room temperature.
引用
收藏
页码:6824 / 6826
页数:3
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