SI 2P CORE-LEVEL SHIFTS AT THE SI(001) SIO2 INTERFACE - A FIRST-PRINCIPLES STUDY

被引:190
作者
PASQUARELLO, A
HYBERTSEN, MS
CAR, R
机构
[1] AT&T BELL LABS,MURRAY HILL,NJ 07974
[2] UNIV GENEVA,DEPT CONDENSED MATTER PHYS,CH-1211 GENEVA,SWITZERLAND
关键词
D O I
10.1103/PhysRevLett.74.1024
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Using a first-principles approach, we calculate core-level shifts at the Si(001)-SiO2 interface. By fully relaxing interfaces between Si and tridymite, a crystalline form of SiO2, we obtain interface models with good local structural properties and with no electronic states in the Si gap. Calculated values of Si 2p core-level shifts agree well with data from photoemission experiments and show a linear dependence on the number of nearest-neighbor oxygen atoms. Core-hole relaxation accounts for ∼50% of the total shifts, in good agreement with Auger experiments. © 1995 The American Physical Society.
引用
收藏
页码:1024 / 1027
页数:4
相关论文
共 38 条
[1]   HRTEM OBSERVATION OF THE SI/SIO2 INTERFACE [J].
AKATSU, H ;
OHDOMARI, I .
APPLIED SURFACE SCIENCE, 1989, 41-2 :357-364
[2]   PSEUDOPOTENTIALS THAT WORK - FROM H TO PU [J].
BACHELET, GB ;
HAMANN, DR ;
SCHLUTER, M .
PHYSICAL REVIEW B, 1982, 26 (08) :4199-4228
[3]   SI 2P CORE-LEVEL CHEMICAL-SHIFTS AT THE H/SI(111)-(1X1) SURFACE [J].
BLASE, X ;
DASILVA, AJR ;
ZHU, XJ ;
LOUIE, SG .
PHYSICAL REVIEW B, 1994, 50 (11) :8102-8105
[4]   UNIFIED APPROACH FOR MOLECULAR-DYNAMICS AND DENSITY-FUNCTIONAL THEORY [J].
CAR, R ;
PARRINELLO, M .
PHYSICAL REVIEW LETTERS, 1985, 55 (22) :2471-2474
[5]   ABINITIO CALCULATION OF PHONON DISPERSIONS IN II-VI-SEMICONDUCTORS [J].
DALCORSO, A ;
BARONI, S ;
RESTA, R ;
DEGIRONCOLI, S .
PHYSICAL REVIEW B, 1993, 47 (07) :3588-3592
[6]   X-RAY-SCATTERING STUDIES OF THE SI-SIO2 INTERFACE [J].
FUOSS, PH ;
NORTON, LJ ;
BRENNAN, S ;
FISCHERCOLBRIE, A .
PHYSICAL REVIEW LETTERS, 1988, 60 (07) :600-603
[7]   HIGH-RESOLUTION X-RAY PHOTOELECTRON-SPECTROSCOPY AS A PROBE OF LOCAL ATOMIC-STRUCTURE - APPLICATION TO AMORPHOUS SIO2 AND THE SI-SIO2 INTERFACE [J].
GRUNTHANER, FJ ;
GRUNTHANER, PJ ;
VASQUEZ, RP ;
LEWIS, BF ;
MASERJIAN, J ;
MADHUKAR, A .
PHYSICAL REVIEW LETTERS, 1979, 43 (22) :1683-1686
[8]   THE LOCALIZATION AND CRYSTALLOGRAPHIC DEPENDENCE OF SI SUBOXIDE SPECIES AT THE SIO2/SI INTERFACE [J].
GRUNTHANER, PJ ;
HECHT, MH ;
GRUNTHANER, FJ ;
JOHNSON, NM .
JOURNAL OF APPLIED PHYSICS, 1987, 61 (02) :629-638
[9]   ATOMIC AND ELECTRONIC-STRUCTURES OF AN INTERFACE BETWEEN SILICON AND BETA-CRISTOBALITE [J].
HANE, M ;
MIYAMOTO, Y ;
OSHIYAMA, A .
PHYSICAL REVIEW B, 1990, 41 (18) :12637-12640
[10]  
HATTORI T, 1989, JPN J APPL PHYS, V8, pL1436