SI 2P CORE-LEVEL SHIFTS AT THE SI(001) SIO2 INTERFACE - A FIRST-PRINCIPLES STUDY

被引:190
作者
PASQUARELLO, A
HYBERTSEN, MS
CAR, R
机构
[1] AT&T BELL LABS,MURRAY HILL,NJ 07974
[2] UNIV GENEVA,DEPT CONDENSED MATTER PHYS,CH-1211 GENEVA,SWITZERLAND
关键词
D O I
10.1103/PhysRevLett.74.1024
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Using a first-principles approach, we calculate core-level shifts at the Si(001)-SiO2 interface. By fully relaxing interfaces between Si and tridymite, a crystalline form of SiO2, we obtain interface models with good local structural properties and with no electronic states in the Si gap. Calculated values of Si 2p core-level shifts agree well with data from photoemission experiments and show a linear dependence on the number of nearest-neighbor oxygen atoms. Core-hole relaxation accounts for ∼50% of the total shifts, in good agreement with Auger experiments. © 1995 The American Physical Society.
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页码:1024 / 1027
页数:4
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