NEW TRENDS IN ION-BEAM ANALYSIS

被引：11
|
作者：
DAVID, D
机构：
[1] University of Technology, Compiègne
来源：
SURFACE SCIENCE REPORTS | 1992年 / 16卷 / 07期
关键词：
D O I：
10.1016/0167-5729(92)90001-R
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Ion-beam analytical methods have been developed on the basis of the interaction of charged particles with matter. Since thirty years, major developments have taken place, and several different techniques are now available to solve most of the analytical problems. This review paper recalls physical principles and provides an overview of NRA, RBS, ERDA, PIXE and PIGME. Some typical trends, such as the nuclear microprobe, are described.
引用
收藏
页码：333 / 375
页数：43
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