A USEFUL APPROXIMATION OF THE EXIT WAVE-FUNCTION IN COHERENT STEM

被引：22
作者：
BROECKX, J
DEBEECK, MO
VANDYCK, D
机构：
[1] EMAT, Universiteit Antwerpen, B-2020 Antwerpen
来源：
ULTRAMICROSCOPY | 1995年 / 60卷 / 01期
关键词：
D O I：
10.1016/0304-3991(95)00053-4
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
The exit wave function in coherent STEM can be factorised in a probe function and an object function for non-phase objects under certain restrictions on specimen thickness and probe smoothness. This has important consequences for direct reconstruction of the specimen structure from electron microscope images: e.g. for phase retrieval and deconvolution techniques.
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页码：71 / 80
页数：10
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