U-SHAPED DISTRIBUTIONS AT SEMICONDUCTOR INTERFACES AND THE NATURE OF THE RELATED DEFECT CENTERS

被引：17
作者：
FLIETNER, H
机构：
来源：
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 1985年 / 91卷 / 01期
关键词：
D O I：
10.1002/pssa.2210910120
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：153 / 164
页数：12
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