ATOMIC-RESOLUTION IMAGING AND ANALYSIS WITH THE STEM

Recent instrumental developments in the high-resolution scanning transmission electron microscope (STEM) offer the promise of combining incoherent imaging and spectroscopic analysis at atomic resolution, even in the presence of strong dynamical diffraction of low-order diffracted beams. This extends the realm of intuitive structure determination to substantially greater thicknesses and higher resolution than conventional methods. Recent applications to the study of interfacial structures and atomistic mechanisms of growth are described, along with indications of future directions.