AN APPLICATION OF A LINEAR COORDINATE DETECTOR FOR RECORDING THE DIFFUSE-X-RAY SCATTERING IN CRYSTALS WITH MICRODEFECTS

被引：0

作者：

KOVYEV, EK

PONOMAREV, YV

DEIGEN, MI

GOGANOV, DA

OVCHINNIKOV, EK

机构：

[1] MV LOMONOSOV STATE UNIV,MOSCOW 117234,USSR

[2] BUREVESTNIK SCI IND ASSOC,LENINGRAD,USSR

来源：

KRISTALLOGRAFIYA | 1984年 / 29卷 / 06期

关键词：

D O I：

暂无

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：1185 / 1186

页数：2

共 7 条

[1] AFANASYEV AM, 1981, KRISTALLOGRAFIYA+, V26, P28
[2] APPLICATIONS OF X-RAY TRIPLE CRYSTAL DIFFRACTOMETRY TO STUDIES ON THE DIFFUSION-INDUCED DEFECTS IN SILICON-CRYSTALS
IIDA, A
[J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1979, 54 (02): : 701 - 706
[3] SEPARATE MEASUREMENTS OF DYNAMICAL AND KINEMATICAL X-RAY DIFFRACTIONS FROM SILICON-CRYSTALS WITH A TRIPLE CRYSTAL DIFFRACTOMETER
IIDA, A
KOHRA, K
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1979, 51 (02): : 533 - 542
[4] KOVEV EK, 1981, FIZ TVERD TELA+, V23, P1626
[5] KOVEV EK, 1981, ELEKTRONNAYA TEKHNIK, P27
[6] KRIVOGLAZ MA, 1967, TEORIYA RASSEYANIYA
[7] X-RAY DIFFUSE-SCATTERING FROM SILICON CONTAINING OXYGEN CLUSTERS
PATEL, JR
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1975, 8 (APR1) : 186 - 191