THERMAL-WAVE MICROSCOPY - A NEW APPLICATION OF THE SCANNING ELECTRON-MICROSCOPE

被引：0

|

作者：

BRANDIS, EK ^{[1
]}

机构：

[1] IBM CORP,HOPEWELL JUNCTION,NY 12533

来源：

IEEE TRANSACTIONS ON SONICS AND ULTRASONICS | 1981年 / 28卷 / 05期

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D O I：

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中图分类号：

O42 [声学];

学科分类号：

070206 ; 082403 ;

摘要：

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页码：362 / 362

页数：1

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