MEASUREMENTS OF THE BREMSSTRAHLUNG BACKGROUND IN SOFT-X-RAY APPEARANCE-POTENTIAL SPECTROSCOPY

被引：1
作者：
SHINDE, PS
PADALIA, BD
机构：
[1] INDIAN INST TECHNOL,DEPT PHYS,BOMBAY 400076,INDIA
[2] INDIAN INST TECHNOL,CTR REG SOPHISTICATED INSTRUMENTAT,BOMBAY 400076,INDIA
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1993年 / 82卷 / 01期
关键词：
D O I：
10.1016/0168-583X(93)95103-C
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
In continuation of our recent report on the design and construction of a versatile soft x-ray appearance potential spectrometer using a Cu-BeO photoelectron multiplier, the results of our measurements of the bremsstrahlung background as a function of spectrometer parameters are discussed.
引用
收藏
页码：196 / 199
页数：4
相关论文
共 4 条
[1]   SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPY STUDY OF NI-FE ALLOYS [J].
CHOURASIA, AR ;
CHOPRA, DR .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1989, 40-1 :376-378
[2]   LALPHA LINE SHAPES OF COBALT, NICKEL AND COPPER NEAR THRESHOLD OF EXCITATION [J].
DEV, B ;
BRINKMAN, H .
PHYSICA, 1972, 57 (04) :616-&
[3]   A VERSATILE SOFT-X-RAY APPEARANCE POTENTIAL SPECTROMETER [J].
PADALIA, BD ;
SHINDE, PS ;
KORGAONKAR, AV ;
CARVALHO, WCJ .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, 62 (04) :1109-1110
[4]   SOFT X-RAY APPEARANCE POTENTIAL SPECTROMETER FOR ANALYSIS OF SOLID SURFACES [J].
PARK, RL ;
HOUSTON, JE ;
SCHREINER, DG .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (12) :1810-+
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